Dynamic Analysis of a CSTR using Aspen Dynamics
Sarath Babu AnnePraveen Kumar Bommineni
National Institute of Technology, Department Of Chemical Engineering
摘要：Present study is aimed at carrying out dynamic simulation of a continuous stirred tank reactor using Aspen Dynamics which is useful for finding required control structure to the process, controller parameters, controller interactions and response of the system for various disturbances in feed as well as products.Exothermic reaction of ethylene and benzene carried out in a continuous stirred tank reactor （CSTR） to form desired product Ethyl benzene and the undesired product diethyl benzene is studied.Two controllers （temperature controller and level controller） are used in the present simulation. Temperature controller maintains the reactor temperature at the set point value by manipulating the coolant temperature. Level controller operates in such a way to maintain liquid level in the reactor according to set point value by manipulating the valve position. The response of the process has been found to be faster in the case when controller with tuned controller parameters compared to that with default parameters. The response of the process was found to be better when controller with Ziegler-Nicholos tuned parameters were used in the case of servo problem, whereas Tyreus-Luyben controller tuning parameters were found to be better in the case of regulatory problem subjected to a ramp disturbance. It has also been observed that disturbance in temperature had effect on reactor liquid level. Contrastingly, disturbance in level had no effect on temperature.
International Conference on Bioscience,Biochemistry and Pharmaceutical Sciences（ICBBPS’2012）;International Conference on Chemical,Environmental and Biological Sciences（ICCEBS’2012）;International Conference on Management,Behavioral Sciences and Economics Issues（ICMBSE’2012）;International Conference on Mechanical,Automobile and Robotics Engineering（ICMAR’2012）;International Conference on Computational Techniques and Artificial Intelligence（ICCTAI’2012）;International Conference on Advances in Electrical and Electronics Engineering（ICAEE’2012）