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Zone Axis Critical Voltage and Microanalysis of Oxygen Concentration in YBa2Cu3O7-y

Y.TomokiyoY.TanakaT.Fujimoto

Research Laboratory of High Voltage Electron Microscope, Kyushu University 36,Fukuoka 812-81,JapanPresent address:TDK Co.Ltd.,Tokyo,Japan

摘要:<正>Introduction The critical voltage effect is a result of interaction of relativistic effect of fast electron and many-beam dynamical diffraction effect.The critical voltage effect occurs at a certain accelerating voltage as degeneracy of main two branches in dispersion surfaces.The critical voltage effect is found as contrast anomaly in a diffraction pattern under excitation of systematic reflections1)(systematic critical voltage)or zone axis incidence2)(zone axis critical voltage).A value of the systematic or zone axis critical voltage sensitively depends on low order structure factors of crystal and temperature.Consequently the critical voltage of a compound or a solid solution alloy depends on its composition through average structure factors3).A measurement of the systematic or zone axis critical voltage enables us to know local change in concentration of compounds4).A value of the systematic critical voltage is generally larger than the one of the zone axis critical voltage and hence a high voltage electron microscope is usually necessary for measurement of the former5).On the other hand,most of zone axis critical voltages occur below 400 kV.We wilt examine local change in composition using a conventional TEM.
会议名称:

The Eighth Chinese-Japanese Electron Microscopy Seminar

会议时间:

1995-05

会议地点:

中国福建武夷山

  • 专辑:

    工程科技Ⅰ辑

  • 专题:

    金属学及金属工艺

  • 分类号:

    TG115

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